[lug] advice on disk error messages

Phil Rasch pjr at ucar.edu
Tue May 15 22:30:45 MDT 2007


I have started seeing these messages in the /var/log/messages.

May 15 19:40:39 machine -- MARK --
May 15 20:00:40 machine -- MARK --
May 15 20:11:39 machine kernel: [18736226.168000] hde: dma_intr: status=0x51 { DriveReady SeekComplete Error }
May 15 20:11:39 machine kernel: [18736226.168000] hde: dma_intr: error=0x40 { UncorrectableError }, LBAsect=12
0308751, high=7, low=2868239, sector=120308751
May 15 20:11:39 machine kernel: [18736226.168000] ide: failed opcode was: unknown
May 15 20:11:39 machine kernel: [18736226.168000] end_request: I/O error, dev hde, sector 120308751
May 15 20:40:43 machine -- MARK --
May 15 21:00:45 machine -- MARK --
May 15 21:20:46 machine -- MARK --
May 15 21:40:47 machine -- MARK --

/dev/hde is one disk of a RAID1.

running 

 mdadm -Q --detail /dev/md0

suggests that both disks are up.

I append the output of smartctl -a /dev/hde below.

Can someone offer advice on whether it is time to start hunting for another
disk, or are things OK?

Thanks

Phil


smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda 7200.7 and 7200.7 Plus family
Device Model:     ST3120026A
Serial Number:    3JT2D65G
Firmware Version: 3.06
User Capacity:    120,034,123,776 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   6
ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 2
Local Time is:    Tue May 15 22:27:09 2007 MDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                 ( 430) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        No General Purpose Logging support.
Short self-test routine 
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        (  85) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   053   046   006    Pre-fail  Always       -       210073619
  3 Spin_Up_Time            0x0003   096   096   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       0
  5 Reallocated_Sector_Ct   0x0033   054   054   036    Pre-fail  Always       -       1851
  7 Seek_Error_Rate         0x000f   087   060   030    Pre-fail  Always       -       554977001
  9 Power_On_Hours          0x0032   066   066   000    Old_age   Always       -       29915
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always       -       161
194 Temperature_Celsius     0x0022   035   045   000    Old_age   Always       -       35
195 Hardware_ECC_Recovered  0x001a   053   046   000    Old_age   Always       -       210073619
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       196
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       196
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age   Offline      -       0
202 TA_Increase_Count       0x0032   133   030   000    Old_age   Always       -       223

SMART Error Log Version: 1
ATA Error Count: 11 (device log contains only the most recent five errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 11 occurred at disk power-on lifetime: 29913 hours (1246 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 0f c4 2b e0  Error: UNC 8 sectors at LBA = 0x002bc40f = 2868239

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 0f c4 2b e0 00      01:25:04.299  READ DMA EXT
  25 00 08 17 88 30 e0 00      01:25:04.282  READ DMA EXT
  25 00 08 0f 88 30 e0 00      01:25:04.275  READ DMA EXT
  25 00 08 df 87 30 e0 00      01:25:04.255  READ DMA EXT
  25 00 08 8f 29 4d e0 00      01:25:04.207  READ DMA EXT

Error 10 occurred at disk power-on lifetime: 29907 hours (1246 days + 3 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 e7 13 27 e0  Error: UNC 8 sectors at LBA = 0x002713e7 = 2560999

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 e7 13 27 e0 00      20:50:26.813  READ DMA EXT
  25 00 08 6f 9c 36 e0 00      20:50:26.810  READ DMA EXT
  25 00 08 4f 9c 36 e0 00      20:50:26.806  READ DMA EXT
  25 00 08 2f 9c 36 e0 00      20:50:26.804  READ DMA EXT
  25 00 08 0f 9c 36 e0 00      20:50:29.161  READ DMA EXT

Error 9 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 07 25 1f e0  Error: UNC 8 sectors at LBA = 0x001f2507 = 2041095

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 07 25 1f e0 00      09:54:48.252  READ DMA EXT
  25 00 08 07 25 1f e0 00      09:54:48.246  READ DMA EXT
  25 00 08 ff ed 47 e0 00      09:54:48.243  READ DMA EXT
  25 00 08 97 d5 49 e0 00      09:55:11.806  READ DMA EXT
  25 00 08 77 d5 49 e0 00      09:55:07.242  READ DMA EXT

Error 8 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 07 25 1f e0  Error: UNC 8 sectors at LBA = 0x001f2507 = 2041095

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 07 25 1f e0 00      09:54:48.252  READ DMA EXT
  25 00 08 ff ed 47 e0 00      09:54:48.246  READ DMA EXT
  25 00 08 97 d5 49 e0 00      09:54:48.243  READ DMA EXT
  25 00 08 77 d5 49 e0 00      09:54:48.238  READ DMA EXT
  25 00 08 57 d5 49 e0 00      09:55:07.242  READ DMA EXT

Error 7 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 1f 11 eb e0  Error: UNC 8 sectors at LBA = 0x00eb111f = 15405343

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 1f 11 eb e0 00      09:52:16.694  READ DMA EXT
  25 00 08 1f 11 eb e0 00      09:52:16.678  READ DMA EXT
  25 00 08 1f 86 26 e0 00      09:52:16.671  READ DMA EXT
  25 00 08 ff 3d ef e0 00      09:52:16.644  READ DMA EXT
  25 00 20 8f 69 e9 e0 00      09:52:16.622  READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.





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