[lug] advice on disk error messages
Phil Rasch
pjr at ucar.edu
Tue May 15 22:30:45 MDT 2007
I have started seeing these messages in the /var/log/messages.
May 15 19:40:39 machine -- MARK --
May 15 20:00:40 machine -- MARK --
May 15 20:11:39 machine kernel: [18736226.168000] hde: dma_intr: status=0x51 { DriveReady SeekComplete Error }
May 15 20:11:39 machine kernel: [18736226.168000] hde: dma_intr: error=0x40 { UncorrectableError }, LBAsect=12
0308751, high=7, low=2868239, sector=120308751
May 15 20:11:39 machine kernel: [18736226.168000] ide: failed opcode was: unknown
May 15 20:11:39 machine kernel: [18736226.168000] end_request: I/O error, dev hde, sector 120308751
May 15 20:40:43 machine -- MARK --
May 15 21:00:45 machine -- MARK --
May 15 21:20:46 machine -- MARK --
May 15 21:40:47 machine -- MARK --
/dev/hde is one disk of a RAID1.
running
mdadm -Q --detail /dev/md0
suggests that both disks are up.
I append the output of smartctl -a /dev/hde below.
Can someone offer advice on whether it is time to start hunting for another
disk, or are things OK?
Thanks
Phil
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family
Device Model: ST3120026A
Serial Number: 3JT2D65G
Firmware Version: 3.06
User Capacity: 120,034,123,776 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Tue May 15 22:27:09 2007 MDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 053 046 006 Pre-fail Always - 210073619
3 Spin_Up_Time 0x0003 096 096 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0033 054 054 036 Pre-fail Always - 1851
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail Always - 554977001
9 Power_On_Hours 0x0032 066 066 000 Old_age Always - 29915
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 161
194 Temperature_Celsius 0x0022 035 045 000 Old_age Always - 35
195 Hardware_ECC_Recovered 0x001a 053 046 000 Old_age Always - 210073619
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 196
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 196
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 133 030 000 Old_age Always - 223
SMART Error Log Version: 1
ATA Error Count: 11 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 11 occurred at disk power-on lifetime: 29913 hours (1246 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 0f c4 2b e0 Error: UNC 8 sectors at LBA = 0x002bc40f = 2868239
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 0f c4 2b e0 00 01:25:04.299 READ DMA EXT
25 00 08 17 88 30 e0 00 01:25:04.282 READ DMA EXT
25 00 08 0f 88 30 e0 00 01:25:04.275 READ DMA EXT
25 00 08 df 87 30 e0 00 01:25:04.255 READ DMA EXT
25 00 08 8f 29 4d e0 00 01:25:04.207 READ DMA EXT
Error 10 occurred at disk power-on lifetime: 29907 hours (1246 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e7 13 27 e0 Error: UNC 8 sectors at LBA = 0x002713e7 = 2560999
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 e7 13 27 e0 00 20:50:26.813 READ DMA EXT
25 00 08 6f 9c 36 e0 00 20:50:26.810 READ DMA EXT
25 00 08 4f 9c 36 e0 00 20:50:26.806 READ DMA EXT
25 00 08 2f 9c 36 e0 00 20:50:26.804 READ DMA EXT
25 00 08 0f 9c 36 e0 00 20:50:29.161 READ DMA EXT
Error 9 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 07 25 1f e0 Error: UNC 8 sectors at LBA = 0x001f2507 = 2041095
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 07 25 1f e0 00 09:54:48.252 READ DMA EXT
25 00 08 07 25 1f e0 00 09:54:48.246 READ DMA EXT
25 00 08 ff ed 47 e0 00 09:54:48.243 READ DMA EXT
25 00 08 97 d5 49 e0 00 09:55:11.806 READ DMA EXT
25 00 08 77 d5 49 e0 00 09:55:07.242 READ DMA EXT
Error 8 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 07 25 1f e0 Error: UNC 8 sectors at LBA = 0x001f2507 = 2041095
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 07 25 1f e0 00 09:54:48.252 READ DMA EXT
25 00 08 ff ed 47 e0 00 09:54:48.246 READ DMA EXT
25 00 08 97 d5 49 e0 00 09:54:48.243 READ DMA EXT
25 00 08 77 d5 49 e0 00 09:54:48.238 READ DMA EXT
25 00 08 57 d5 49 e0 00 09:55:07.242 READ DMA EXT
Error 7 occurred at disk power-on lifetime: 29897 hours (1245 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 1f 11 eb e0 Error: UNC 8 sectors at LBA = 0x00eb111f = 15405343
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 1f 11 eb e0 00 09:52:16.694 READ DMA EXT
25 00 08 1f 11 eb e0 00 09:52:16.678 READ DMA EXT
25 00 08 1f 86 26 e0 00 09:52:16.671 READ DMA EXT
25 00 08 ff 3d ef e0 00 09:52:16.644 READ DMA EXT
25 00 20 8f 69 e9 e0 00 09:52:16.622 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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