[lug] Antenna Parameter Measurement by Near-Field Techniques (fwd)

[Wayde Allen]

What the heck.  I'll send this one too.  There may be some of you involved
with wireless networking for instance.

- Wayde
  (wallen at boulder.nist.gov)

---------- Forwarded message ----------
Date: Mon, 08 May 2000 15:15:14 -0600
From: Wendy Ortega <ortegaw at boulder.nist.gov>
Subject: Antenna Parameter Measurement by Near-Field Techniques

Space is still available for the upcoming 

Antenna Parameter Measurement by Near-Field Techniques Short Course 
May 16 - 18, 2000 

at the National Institute of Standards and Technology, 325 Broadway, Boulder,
Colorado

Course Description

This course is designed for engineers and scientists concerned with the
accurate measurement of antenna parameters.  Major emphasis will be placed on
the theory of near-field antenna-antenna interactions, applications to
near-field scanning on planar, cylindrical, and spherical surfaces, and the
computation of desired antenna characteristics from near-field data. 
Comparisons will be made of the planar, cylindrical, and spherical scanning
methods, and the advantages and disadvantages of each will be discussed.  In
addition, the extrapolation method of determining absolute gain and
polarization will be treated and probe pattern measurements discussed.

The attendee should have a background equivalent to a Bachelor=s degree in
engineering or physics.



Tuesday May 16, 2000

C       Introduction to antenna and microwave measurements

C       Introduction to near-field measurements

C       Polarization - theory and measurements 

C       Probe characterization


Wednesday May 17, 2000

C       Planar near-field theory

C       Planar near-field measurements

C       Cylindrical near-field theory

C       In-depth laboratory tour


Thursday May 18, 2000

C       Spherical near-field theory

C       Uncertainty analysis

C       Spherical and cylindrical near-field measurements

C       Discussion


For further technical information contact Mike Francis (303) 497-5873, e-mail:
<francis at boulder.nist.gov>.  

To register online:
https://sales.nist.gov/conf/secure/CONF198/conf_register.htm

Registration fee: $1000 

For general information contact  Wendy Ortega Henderson (303) 497-3693, e-mail:
ortegaw at boulder.nist.gov, fax: (303) 497-5222

 
________________________________________________________________________

Wendy Ortega Henderson                          Voice:  303-497-3693 
Conference Program Manager                              FAX:   303-497-5222
Public and Business Affairs Division, 346               Email: 
ortegaw at boulder.nist.gov
National Institute of Standards and Technology             
325 Broadway, Boulder, CO   80303  USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website:             http://www.nist.gov/conferences
NIST Website:           http://www.nist.gov

"A pessimist sees the difficulty in every opportunity; 
an optimist sees the opportunity in every difficulty."  
-Winston Churchill-


________________________________________________________________________

Wendy Ortega Henderson                          Voice:  303-497-3693 
Conference Program Manager                              FAX:   303-497-5222
Public and Business Affairs Division, 346               Email: 
ortegaw at boulder.nist.gov
National Institute of Standards and Technology             
325 Broadway, Boulder, CO   80303  USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website:             http://www.nist.gov/conferences
NIST Website:           http://www.nist.gov

"A pessimist sees the difficulty in every opportunity; 
an optimist sees the opportunity in every difficulty."  
-Winston Churchill-